図9 高層化が進む3D NANDの積層数(Stack Height -Scaling) 出所:JEONGDONG CHOE , “Micron B47R 3D CTF CuA NAND Die, World’s First 176L (195T)”, AUGUST 19TH, 2021 , https://semiengineering.com/micron-b47r-3d-ctf-cua-nand-die-worlds-first-176l-195t/
湯之上隆(微細加工研究所),EE Times Japan